MUNICH--(BUSINESS WIRE)--Cadence Design Systems, Inc. (NASDAQ: CDNS) today introduced the Cadence ® Legato™ Reliability Solution, the industry’s first software product that meets the challenges of ...

Using computer models to simulate product behavior was first used mainly to replace hardware prototyping to assess design performance at the end of the development cycle. However, with increasingly ...

Until very recently, semiconductor design, verification, and test were separate domains. Those domains have since begun to merge, driven by rising demand for reliability, shorter market windows, and ...

This is part two of Craig Hillman’s article on reliability in electronic design. Click here to read his first article, "The End is Near for MIL-HDBK-217 and Other Outdated Handbooks." Welcome to the ...

Collaboration enables SoC manufacturers to improve their qualification envelope to achieve lifetime reliability, shorten their root cause analysis time, and reduce operational costs HAIFA, ...

Acquisition integrates advanced "shift-left" Design for Test (DFT) functionality into Siemens' Xpedition and Valor portfolios ...

XIAN HIGH-TECH AREA, SHAANXI, CHINA, January 19, 2026 /EINPresswire.com/ -- With increasing demands for product ...

The impact of materials on designing reliable devices. How packaging plays an important role in SiC MOSFET design. Determining the FIT rate for SiC MOSFETs. There’s no doubt that the material ...

Siemens plans to integrate Aster's advanced "shift-left" design for test functionality into Siemens' Xpedition and Valor ...

Automotive integrated circuits (ICs) are the critical drivers behind modern vehicle automation, safety, and efficiency. As electronic systems in automobiles become increasingly complex, robust testing ...

An emphasis of improving semiconductor quality is beginning to spread well beyond just data centers and automotive applications, where ICs play a role in mission- and safety-critical applications. But ...

This strategic move integrates ASTER’s advanced "shift-left" design for test (DFT) functionality directly into Siemens' ...