The Model 104A-1 Thermo-Probe probe tests components by applying pinpoint heat accurate to within ±1°C. Used to test devices such as diodes, resistors, and transistors, the probe takes seconds to heat ...

Tanaka Precious Metal Technologies has developed TK-SR, a rhodium-based material for probe pins used in probe cards during semiconductor front-end testing. Save my User ID and Password Some ...

IC test interface solution providers, which include probe cards and IC test sockets, are engaged in price negotiations with their fabless clients as demand for wireless devices falls, according to ...

TANAKA Kikinzoku Kogyo K.K. (Head office: Chuo-ku, Tokyo; Representative Director & CEO: Koichiro Tanaka), which develops industrial precious metal products as one of the core companies of TANAKA ...

During standardized chip fabrication, integrate circuit (IC) testing is conducted repeatedly to inspect the chips once they are manufactured. IC testing begins with wafer penetration before etched ...

FormFactor is experiencing strong growth in high-bandwidth memory (HBM) probe card demand, with HBM revenue nearly doubling in Q1 2024 compared to H2 2023. The company is benefiting from the increased ...

The need for high-frequency semiconductor devices is surging, fueled by growing demand for advanced telecommunications, faster sensors, and increasingly autonomous vehicles. The advent of ...

Delicate features, uneven surfaces, and extreme density make it difficult to manage probe force and ensure reliability.