Designs with LogicBIST exhibit random pattern resistance because of the random nature of LBIST vectors, thus leading to low fault coverage. To handle this, we insert test points with the help of ...

The demand for new and upgraded features is increasing day by day in modern semiconductors. This may include multiple power domains to support low power and full power modes and multiple clock domains ...

Under the potential outcomes framework, we propose a randomization based estimation procedure for causal inference from split-plot designs, with special emphasis on 2² designs that naturally arise in ...