(Nanowerk News) Turning up the intensity of x-ray beams used to probe the atomic structures of materials can actually reduce the intensity of x-rays scattered from the material, a RIKEN-led team has ...

High-energy X-ray diffraction patterns from a single grain of i-Gd-Cd were taken at the Advanced Photon Source at Argonne National Laboratory with the beam parallel to the five-fold axis.

For many decades, the method to obtain atomic-level descriptions of chemical compounds and materials—be it a drug, a catalyst ...

If you enjoyed this article, I’d like to ask for your support. Scientific American has served as an advocate for science and industry for 180 years, and right now may be the most critical moment in ...

Particle size analysis is crucial to quality control and product development in a number of key industries including aerosols, construction, food and beverage, paint and coatings, and pharmaceuticals.

When last we saw [xoreaxeax], he had built a lens-less optical microscope that deduced the structure of a sample by recording ...

The new method can determine crystal structures underlying experimental data thus far difficult to analyze. A joint research team led by Yuuki Kubo and Shiji Tsuneyuki of the University of Tokyo has ...

With the development of different techniques for the synthesis of nanomaterials, researchers are constantly looking for a more precise instrument for their nanoscale characterization. X-ray ...