Abstract: This article presents a theoretical framework for deriving simple analytical expressions for spurs resulting from second and third order nonlinearities in fractional-N phase locked loops ...
The semi-test-library-dotnet repository contains the source code for the Semiconductor Test Library written in C# using the .NET Framework. For the latest release, visit the GitHub Releases page.
Some results have been hidden because they may be inaccessible to you
Show inaccessible results